Optical Characterization

The optical characterization plateform of the IPCMS offers an access to: an absorption spectrometer,
a spectrofluorimeter and an optical profilometer. It is open to all IPCMS personnel and to exterior
researchers working for accademic or industrial laboratories.

SPECTROFLUORIMETER

Spectroflurimeter FLUOROLOG 3 – HORIBA JOBIN YVON

Spectrale range :
Excitation from 250 nm to 700 nm.
Emission from 350 nm to 900 nm.
Measurement of emission spectra, excitation spectra or “2D” (scanning of both excitation and emission wavelength).
The polarization resolution is available for excitation and emission.
Samples :
Liquid solutions: 1 cm x 1 cm spectroscopy cuvette holder.
Powders and diffusing materials: integrating sphere adapted for quartz tubes.

SPECTROMETRE D’ABSORPTION

Spectrophotomètre UV-Vis-PIR Perkin-Elmer Lambda 950
Spectrale range :
from 190 nm to 3300 nm for transmission and reflection operations.
from 190 nm to 2500 nm with integrating sphere.
Samples :
Liquid solutions: 1 cm x 1 cm spectroscopy cuvette holder.
Films: microscopy slide holder.
Powders and diffusing materials: integrating sphere.
Possibility to measure specular reflection for thin films at various angles.

PROFILOMETRE OPTIQUE

Profilomètre optique Zygo Newview
The optical profilometer measures the sample topography at the microscopic scale. It is particularly well adapted for contact free measurement of the thickness of thin films.
In plane resolution: 3 µm
Vertical resolution: 2 nm
Maximum thickness: 100 µm

Contacts :

Chargé de Recherche, Ultrafast Optics and Nanophotonics (DON)loic.mager@ipcms.unistra.fr
Station: +33(0)3 88 10 70 90Office: 2051
Technicien de la Recherche, Ultrafast Optics and Nanophotonics (DON)damien.cianfarani@ipcms.unistra.fr
Station: +33(0)3 88 10 72 69Office: 2206

Reservation for optical characterization plateform