X-ray diffraction platform

The X-ray diffraction platform, certified ISO 9001 : 2015, is equipped with several X-Ray diffractometers allowing use to study powder thin film and single crystal samples:

In addition, the laboratory owns updated crystallographic databases (ICDD-PDF) for phase identification. The related activities concern all the crystallographic studies from phase identification up to powder structure determination.

Many information can be obtained from crystallized material such as:

  • Phase identification
  • Cell parameters measurement
  • Structural resolution
  • Strain measurement
  • Texture measurement
  • Epitaxic relationship determination
  • Reciprocal space mapping
  • Experiment on small amount of material

For further information or request for an estimate see the contactes section.

Contacts

Marc LENERTZ

Ingénieur de Recherche, Inorganic Materials Chemistry (DCMI)marc.lenertz@ipcms.unistra.fr
Station: +33(0)3 88 10 71 84Office: 2012
See personal page
Chargé de Recherche, Inorganic Materials Chemistry (DCMI)christophe.lefevre@ipcms.unistra.fr
Station: +33(0)3 88 10 71 28Office: 2008
See personal page

Powders: Bruker D8

Powder diffractometer equipped with a multichannel fast detector making it possible to measure small amount of material. The detector is also energy filtered, getting rid of the fluorescence, allowing to mea element like Co, Fe or Mn.

Usages

  • Phase identification
  • Cell parameters measurement
  • Structural resolution
  • Strain measurement

Technical characteristics

  • Generator : Cu tube (λ1= 1.5406 Å)
  • Geometry : Bragg­-Brentano (transmission geometry also available on demand)
  • Ge front monochromator
  • Lynceye energy-dispersive 1-D detector (192 channels, 4° wide)
  • Room temperature

Thin films: Smartlab Rigaku

The Rigaku Smartlab diffractometer is dedicated for thin films and textured material analysis. Its rotating anode provide a very high flux allowing the measurement of small amount of material.

Usages

  • Thickness and roughness measurement (thickness < 200 nm)
  • Texture measurement
  • Phase identification
  • Cell parameters measurement
  • Strain measurement
  • Epitaxic relationship determination

Technical characteristics

  • Generator : 9kW Cu rotating anode (λ1= 1.5406 Å)
  • Geometry : Parallel beam or Bragg­-Brentano
  • Ge 2 x Ge (220) front monochromator
  • Ge 2 x Ge (220) back monochromator available on demand
  • 0-D detector with automatic attenuator
  • Normal temperature and pressure conditions

Single crystals: Nonius Kappa CCD

Single crystal diffractometer for crystal structure determination. A stereo microscope is available for crystal mounting as well as a workstation with software such as Jana2006 or WingX (ShelX) for crystal determination and refinement.

Usages

  • Crystal structure determination

Technical characteristics

  • Generator: Mo tube (λ1= 0.71 Å)
  • Geometry: Kappa
  • Graphite monochromator
  • 2D CCD detector
  • Temperature from 77 K to room temperature
  • Leica M80 stereo microscope with polarized light and a IC80 HD camera