Scanning tunneling microscopy (STM) within the DSI focuses on the electronic, spin-related and luminescence properties of single objects such as metallic nanostructures, molecules and atoms. Various techniques are employed for this purpose ranging from scanning tunneling spectroscopy (unpolarized or spin polarized) to contact measurements. In this latter case, stable and reproducible two-terminal devices can be engineered with atomic control by contacting the tip to the target object.
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